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Analytical Tools

OPIC maintains the following process diagnostics equipment:

  • Atomic Force Microscope - Veeco Innova SPM
  • Innova SPM
    Image courtesy of Veeco, for more information check out the Veeco website.

      -Contact Mode

      -Tapping ModeTM

      -Conductive AFM

      -Electric Field Microscopy

      -Nanolithography


  • Simultaneous TGA/DSC with in line Mass Spec
  • DSC-TGA-Mass Spec

      -TA Q600 DSC/TGA

      -Max temperature 1500 deg. C

      -In-line advanced real-time gas analyzer, Hiden HPR-20


  • FTIR
  • FTIR

      -Nicolet 6700 FTIR Spectrometer

      -In-situ FTIR Transmission and ATR

      -Smart iTR attachment for fast and easy analysis of solids and liquids


  • PV Test Stand
  • DSC-TGA-Mass Spec

      -Six inch square AM 1.5 illuminated area

      -IV curve tracing


  • Real Time Quantum Efficiency Tester
  • Flash QE Tool

      -FlashQE from Tau Science

      -Photon to electron efficiency vs. wavelength

      -Studies surface passivation, carrier lifetime, bulk diffusion length

      -Spectrum collection in less than 2 seconds allows spacial mapping of QE

      -Time-resolved data for degredation studies
      FlashQE Spectrum FlashQE Cell Map

  • ICP
  • ICP

      -AtomScan 16

  • Variable Angle Spectroscopic Ellipsometer (VASE) - J.A. Woollam Co., Inc.

    To use the VASE or for additional information please contact:
    Dr. Brady J. Gibbons, Assistant Professor
    Department of Mechanical, Industrial, and Manufacturing Engineering
    Tel: (541) 737-2427
    Fax: (541) 737-2600
    Email: brady.gibbons@oregonstate.edu
    http://mime.oregonstate.edu/research/gibbons/

  • Variable Angle Spectroscopic Ellipsometer
    J.A. Woollam Co., Inc. VASE, High Speed Monochromator System HS-190 & VASE Module Control VB-400

      -Wavelength: 193~2500nm

      -Reflection and Transmission Ellipsometry

      -Generalized Ellipsometry

      -Reflectance (R) intensity

      -Transmittance (T) intensity

      -Cross-polarized R/T

      -Depolarization

      -Scatterometry

      -Mueller-matrix